CSA announces the tenth round of light source device test report analysis

Recently, the National Semiconductor Lighting Engineering R&D and Industry Alliance (CSA) announced the analysis of the tenth round of device test reports.

one. Test instruction

The tenth round of release of device data was provided by the National Semiconductor Device Quality Supervision and Inspection Center (13th in China Electronics Branch). The data included white light, red light, green light, and blue light source test results at 350mA, and white and blue devices at 20mA. Results and other current under white light, yellow light source test results. The test method standard is SJ/T 11394-2009 semiconductor light-emitting diode test method.

two. Test Results



350mA white light source CRI and CCT change with light efficiency



20mA white light source CRI and CCT change with light efficiency

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The dynamic test technology it used has passed the Type 4 functional safety assessment by TUV, and get the national invention patent. The product reaches the advanced technological level of similar products.
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